Type | Positioning | Technical Features | Application Cases |
Standard Scientific Research Atomic Force Microscope（AFM-R） | Designed for routine scientific research and material characterization requirements, it balances imaging performance and system stability, and is suitable for most nanoscale surface morphology and mechanical testing experiments. |
· Supports contact mode, tapping mode and non-contact mode · Nanometer-scale lateral resolution and sub-nanometer vertical resolution · Closed-loop scanning control with excellent imaging repeatability · Compatible with air environments and optional liquid environments
|
· Characterization of Two-Dimensional Materials: Measuring the layer number, height steps and surface roughness of two-dimensional materials such as graphene, MoS₂ and WSe₂
· Research on Thin-Film Materials: Analyzing the uniformity and surface morphology of sputtered films and evaporated films
· Analysis of Nanostructures: Observing the size distribution and arrangement state of nanoparticles and nanowires
· Scientific Research Experiments in Universities: Applied to routine nanocharacterization experiments in materials science, physics, chemistry and related disciplines
|
High-Resolution Scientific Research Atomic Force Microscope（AFM-HR） | Designed for advanced high-end research requirements, it delivers ultra-high imaging resolution and low system noise performance, making it suitable for atomic or near-atomic structural studies. |
· Ultra-low noise scanning system · Highly stable probe and scanner head structure · Optimized vibration isolation and temperature drift suppression design · Supports long-term stable scanning
|
· Atomic-scale step imaging: Observing atomic steps and lattice structures on the surface of single-crystal materials
· High-quality single crystal research: Analyzing surface defects of epitaxial thin films and as-grown crystals
· Interface and defect research: Investigating microstructures such as dislocations, grain boundaries and step edges
· Cutting-edge fundamental research: Applied to high-level fundamental research projects in physics and materials science fields
|
Multi-functional Extended Atomic Force Microscope（AFM-MF） | Based on conventional morphological imaging, it integrates the testing capabilities of multiple physical quantities and is suitable for multi-dimensional analysis of material properties. |
· Supports advanced modes such as force spectroscopy and phase imaging
· Expandable test modules related to electricity, magnetism and mechanics are available
· Modular design facilitates functional upgrades in later stages
The software supports synchronous acquisition and analysis of multi-channel data |
· Nanomechanical Testing: Measuring the elastic modulus and adhesion force of polymers and thin-film materials
· Functional Materials Research: Conducting multi-parameter analysis on composite materials and functional coatings
· Local Device Analysis: Investigating performance differences across various regions on the surface of micro-nano devices
· Interdisciplinary Research: Comprehensive characterization experiments covering materials, electronics, energy and other fields |
Atomic Force Microscope for Biological and Liquid Environments（AFM-Bio） | Designed specifically for biological samples and liquid environments, it is suitable for nanoscale characterization of soft matter as well as living or quasi-living samples. |
· Support liquid cell and liquid imaging · Low-force scanning to reduce sample damage · Optimized probe control and feedback system · Suitable for soft samples and biological materials
|
· Observation of cell surface morphology: Analyze the nanostructural characteristics of cell membranes
· Research on biomacromolecules: Observe the morphology of biomolecules such as proteins and DNA
· Mechanical research on biological membranes: Study the flexibility and mechanical response of biological membranes
· Life science laboratory: Applied in research related to biophysics and biomaterials |
Atomic Force Microscope for Teaching and Basic Experiments（AFM-Edu） | Designed for university teaching and basic experiments, featuring intuitive structure, simple operation and high safety. |
· Simple structure and stable system · Standardized operation procedures · Suitable for repeated teaching demonstrations Low maintenance cost
|
· Undergraduate and postgraduate teaching: nanotechnology, experimental courses in surface science · Basic experimental training: instruction on AFM imaging principles and operation methods · Teaching demonstration experiments: demonstration of surface morphological characteristics at the nanoscale · Experimental Teaching Center: long-term and stable configuration of teaching equipment
|
